A Discrete Multi-Objective Artificial Bee Colony Algorithm for a Real-World Electronic Device Testing Machine Allocation Problem
Abstract With the continuous development of science and technology, electronic devices have begun to enter all aspects of human life, becoming increasingly closely related to human life. Users have higher quality requirements for electronic devices. Electronic device testing has gradually become an...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2022-10-01
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| Series: | Chinese Journal of Mechanical Engineering |
| Subjects: | |
| Online Access: | https://doi.org/10.1186/s10033-022-00803-3 |