A Discrete Multi-Objective Artificial Bee Colony Algorithm for a Real-World Electronic Device Testing Machine Allocation Problem
Abstract With the continuous development of science and technology, electronic devices have begun to enter all aspects of human life, becoming increasingly closely related to human life. Users have higher quality requirements for electronic devices. Electronic device testing has gradually become an...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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SpringerOpen
2022-10-01
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| Series: | Chinese Journal of Mechanical Engineering |
| Subjects: | |
| Online Access: | https://doi.org/10.1186/s10033-022-00803-3 |
| _version_ | 1828316987959279616 |
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| author | Jin Xie Xinyu Li Liang Gao |
| author_facet | Jin Xie Xinyu Li Liang Gao |
| author_sort | Jin Xie |
| collection | DOAJ |
| description | Abstract With the continuous development of science and technology, electronic devices have begun to enter all aspects of human life, becoming increasingly closely related to human life. Users have higher quality requirements for electronic devices. Electronic device testing has gradually become an irreplaceable engineering process in modern manufacturing enterprises to guarantee the quality of products while preventing inferior products from entering the market. Considering the large output of electronic devices, improving the testing efficiency while reducing the testing cost has become an urgent problem to be solved. This study investigates the electronic device testing machine allocation problem (EDTMAP), aiming to improve the production of electronic devices and reduce the scheduling distance among testing machines through reasonable machine allocation. First, a mathematical model was formulated for the EDTMAP to maximize both production and the scheduling distance among testing machines. Second, we developed a discrete multi-objective artificial bee colony (DMOABC) algorithm to solve EDTMAP. A crossover operator and local search operator were designed to improve the exploration and exploitation of the algorithm, respectively. Numerical experiments were conducted to evaluate the performance of the proposed algorithm. The experimental results demonstrate the superiority of the proposed algorithm compared with the non-dominated sorting genetic algorithm II (NSGA-II) and strength Pareto evolutionary algorithm 2 (SPEA2). Finally, the mathematical model and DMOABC algorithm were applied to a real-world factory that tests radio-frequency modules. The results verify that our method can significantly improve production and reduce the scheduling distance among testing machines. |
| first_indexed | 2024-04-13T17:22:29Z |
| format | Article |
| id | doaj.art-9f27cf66b7d54d38aa680aba439eac4f |
| institution | Directory Open Access Journal |
| issn | 1000-9345 2192-8258 |
| language | English |
| last_indexed | 2024-04-13T17:22:29Z |
| publishDate | 2022-10-01 |
| publisher | SpringerOpen |
| record_format | Article |
| series | Chinese Journal of Mechanical Engineering |
| spelling | doaj.art-9f27cf66b7d54d38aa680aba439eac4f2022-12-22T02:37:56ZengSpringerOpenChinese Journal of Mechanical Engineering1000-93452192-82582022-10-0135111510.1186/s10033-022-00803-3A Discrete Multi-Objective Artificial Bee Colony Algorithm for a Real-World Electronic Device Testing Machine Allocation ProblemJin Xie0Xinyu Li1Liang Gao2State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and TechnologyState Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and TechnologyState Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and TechnologyAbstract With the continuous development of science and technology, electronic devices have begun to enter all aspects of human life, becoming increasingly closely related to human life. Users have higher quality requirements for electronic devices. Electronic device testing has gradually become an irreplaceable engineering process in modern manufacturing enterprises to guarantee the quality of products while preventing inferior products from entering the market. Considering the large output of electronic devices, improving the testing efficiency while reducing the testing cost has become an urgent problem to be solved. This study investigates the electronic device testing machine allocation problem (EDTMAP), aiming to improve the production of electronic devices and reduce the scheduling distance among testing machines through reasonable machine allocation. First, a mathematical model was formulated for the EDTMAP to maximize both production and the scheduling distance among testing machines. Second, we developed a discrete multi-objective artificial bee colony (DMOABC) algorithm to solve EDTMAP. A crossover operator and local search operator were designed to improve the exploration and exploitation of the algorithm, respectively. Numerical experiments were conducted to evaluate the performance of the proposed algorithm. The experimental results demonstrate the superiority of the proposed algorithm compared with the non-dominated sorting genetic algorithm II (NSGA-II) and strength Pareto evolutionary algorithm 2 (SPEA2). Finally, the mathematical model and DMOABC algorithm were applied to a real-world factory that tests radio-frequency modules. The results verify that our method can significantly improve production and reduce the scheduling distance among testing machines.https://doi.org/10.1186/s10033-022-00803-3Electronic deviceMachine allocationMulti-objective optimizationArtificial bee colony algorithm |
| spellingShingle | Jin Xie Xinyu Li Liang Gao A Discrete Multi-Objective Artificial Bee Colony Algorithm for a Real-World Electronic Device Testing Machine Allocation Problem Chinese Journal of Mechanical Engineering Electronic device Machine allocation Multi-objective optimization Artificial bee colony algorithm |
| title | A Discrete Multi-Objective Artificial Bee Colony Algorithm for a Real-World Electronic Device Testing Machine Allocation Problem |
| title_full | A Discrete Multi-Objective Artificial Bee Colony Algorithm for a Real-World Electronic Device Testing Machine Allocation Problem |
| title_fullStr | A Discrete Multi-Objective Artificial Bee Colony Algorithm for a Real-World Electronic Device Testing Machine Allocation Problem |
| title_full_unstemmed | A Discrete Multi-Objective Artificial Bee Colony Algorithm for a Real-World Electronic Device Testing Machine Allocation Problem |
| title_short | A Discrete Multi-Objective Artificial Bee Colony Algorithm for a Real-World Electronic Device Testing Machine Allocation Problem |
| title_sort | discrete multi objective artificial bee colony algorithm for a real world electronic device testing machine allocation problem |
| topic | Electronic device Machine allocation Multi-objective optimization Artificial bee colony algorithm |
| url | https://doi.org/10.1186/s10033-022-00803-3 |
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