Characterization of Parasitic Impedance in PCB Using a Flexible Test Probe Based on a Curve-Fitting Method

Characterization of Parasitic Impedance in PCB Using a Flexible Test Probe Based on a Curve-Fitting Method

Switching in power semiconductors with emerging materials such as silicon carbide (SiC) leads to undesired overvoltages and oscillations that limit switching frequency, largely due to impedance in the current commutation loop. Minimizing this parasitic impedance in printed circuit boards (PCB) requi...

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Bibliographic Details
Main Authors: A. Llamazares, M. Garcia-Gracia, S. Martin-Arroyo
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Curve-fitting procedure
flexible test probe
impedance measurement
parasitic impedance
printed circuit board (PCB)
propagation time
Online Access:https://ieeexplore.ieee.org/document/9371700/

Internet

https://ieeexplore.ieee.org/document/9371700/

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