Noise modelling in time‐of‐flight sensors with application to depth noise removal and uncertainty estimation in three‐dimensional measurement

Noise modelling in time‐of‐flight sensors with application to depth noise removal and uncertainty estimation in three‐dimensional measurement

Time‐of‐flight (TOF) sensors provide real‐time depth information at high frame‐rates. One issue with TOF sensors is the usual high level of noise (i.e. the depth measure's repeatability within a static setting). However, until now, TOF sensors’ noise has not been well studied. The authors show...

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Bibliographic Details
Main Authors: Amira Belhedi, Adrien Bartoli, Steve Bourgeois, Vincent Gay‐Bellile, Kamel Hamrouni, Patrick Sayd
Format: Article
Language:English
Published: Wiley 2015-12-01
Series:IET Computer Vision
Subjects:
noise modelling
time-of-flight sensors
TOF sensors
depth noise removal
uncertainty estimation
3D measurement
Online Access:https://doi.org/10.1049/iet-cvi.2014.0135

Internet

https://doi.org/10.1049/iet-cvi.2014.0135

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