Refractometric Sensing Using High-Order Diffraction Spots From Ordered Vertical Silicon Nanowire Arrays

Refractometric Sensing Using High-Order Diffraction Spots From Ordered Vertical Silicon Nanowire Arrays

We propose to use high-order diffraction spots from 2-D silicon nanowire (NW) arrays for refractive index sensing based on spatial changes in the diffractive spots position. The NW arrays act both as a refractive index sensor and as dispersive elements, eliminating the need for external spectrometer...

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Bibliographic Details
Main Authors: Iman Khodadad, Navneet Dhindsa, Simarjeet S. Saini
Format: Article
Language:English
Published: IEEE 2016-01-01
Series:IEEE Photonics Journal
Subjects:
Silicon nanowires
refractive index sensors
diffraction
spectral analysis
Online Access:https://ieeexplore.ieee.org/document/7444133/

Internet

https://ieeexplore.ieee.org/document/7444133/

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