Scanning Electron Microscopy: Extrapolation of 3D Data from SEM Micrographs

Scanning Electron Microscopy: Extrapolation of 3D Data from SEM Micrographs

<p>n this manuscript we suggest a three-dimensional reconstruction technique to fully characterize structural performance of solid materials. The described technique extrapolates, measures and interprets the 3-dimensional data which is extracted from SEM images, obtained from different angles....

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Bibliographic Details
Main Authors: Simonas KAREIVA, Algirdas SELSKIS, Feliksas IVANAUSKAS, Simas ŠAKIRZANOVAS, Aivaras KAREIVA
Format: Article
Language:English
Published: Kaunas University of Technology 2015-11-01
Series:Medžiagotyra
Subjects:
SEM, 3D images, spatial reconstruction, stereoscopic analysis
Online Access:http://matsc.ktu.lt/index.php/MatSc/article/view/11101

Internet

http://matsc.ktu.lt/index.php/MatSc/article/view/11101

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