Investigation of the Structural, Optical and Electrical Properties of Copper Selenide Thin Films

Investigation of the Structural, Optical and Electrical Properties of Copper Selenide Thin Films

AbstractCopper selenide (CuSe) thin films were prepared by chemical bath deposition (CBD) method. X-ray diffraction (XRD) analysis was used to study the structure and crystallite size of CuSe thin film. The grain size and the surface morphology were studied using Scanning Electron Microscopy (SEM) a...

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Bibliographic Details
Main Authors: Soundararajan Thirumavalavan, Kolandavel Mani, Suresh Sagadevan
Format: Article
Language:English
Published: Associação Brasileira de Metalurgia e Materiais (ABM); Associação Brasileira de Cerâmica (ABC); Associação Brasileira de Polímeros (ABPol) 2015-10-01
Series:Materials Research
Subjects:
CuSe thin films
XRD
SEM
UV analysis
dielectric studies
Online Access:http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392015000501000&tlng=en

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http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392015000501000&tlng=en

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