BiN: A Two-Level Learning-Based Bug Search for Cross-Architecture Binary

With the popularity of IoT (Internet of Things) devices, the security risks of these devices are increasing. However, due to the multisource heterogeneity of IoT devices, there are significant differences between the vulnerability detection of the Internet of Things and the PC-based vulnerability se...

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Bibliographic Details
Main Authors: Hao Wu, Hui Shu, Fei Kang, Xiaobing Xiong
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8920168/