Research on Circuit Level Protection Design of SRAM Single Event Latch-up Effect
SRAM with high density CMOS technology is extremely sensitive to single event latch�up, so it is necessary to adopt corresponding protection strategies in space applications. For CTOS with reduced radiation resistance, circuit level protection becomes an important part to improve system reliability...
| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Editorial Board of Atomic Energy Science and Technology
2022-04-01
|
| Series: | Yuanzineng kexue jishu |
| Subjects: | |
| Online Access: | https://www.aest.org.cn/CN/abstract/abstract21389.shtml |