Valence band offset of InN/BaTiO<sub>3 </sub>heterojunction measured by X-ray photoelectron spectroscopy

Valence band offset of InN/BaTiO<sub>3 </sub>heterojunction measured by X-ray photoelectron spectroscopy

<p>Abstract</p> <p>X-ray photoelectron spectroscopy has been used to measure the valence band offset of the InN/BaTiO<sub>3 </sub>heterojunction. It is found that a type-I band alignment forms at the interface. The valence band offset (VBO) and conduction band offset (C...

Full description

Bibliographic Details
Main Authors: Zhang Weifeng, Jia Caihong, Chen Yonghai, Guo Yan, Liu Xianglin, Yang Shaoyan, Wang Zhanguo
Format: Article
Language:English
Published: SpringerOpen 2011-01-01
Series:Nanoscale Research Letters
Online Access:http://www.nanoscalereslett.com/content/6/1/316

Internet

http://www.nanoscalereslett.com/content/6/1/316

Similar Items