Modeling of the Electrical Characteristics and Degradation Mechanisms of UV-C LEDs

Modeling of the Electrical Characteristics and Degradation Mechanisms of UV-C LEDs

In this paper we investigate the reliability of AlGaN-based UV-C LEDs with an emission wavelength of 265 nm. By submitting the devices to constant current stress, two main electrical degradation processes are identified: a turn-on voltage shift and an increase in the forward leakage current. In part...

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Bibliographic Details
Main Authors: Nicola Roccato, Francesco Piva, Carlo De Santi, Matteo Buffolo, Normal Susilo, Daniel Hauer Vidal, Anton Muhin, Luca Sulmoni, Tim Wernicke, Micheal Kneissl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Format: Article
Language:English
Published: IEEE 2024-01-01
Series:IEEE Photonics Journal
Subjects:
UV-C
Light-Emitting Diodes
Trap-assisted tunneling (TAT)
degradation
modeling
defects
Online Access:https://ieeexplore.ieee.org/document/10404031/

Internet

https://ieeexplore.ieee.org/document/10404031/

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