Piezoelectric effects of single-crystal GaAs and multi-layered AlxGa1-xAs/GaAs material measured by the Michelson interferometer
The inverse piezoelectric effect, in which the strains were electrically induced, in a single crystal of GaAs and in a multilayer structure of AlxGa1-xAs/GaAs was measured using a simple optical system, i.e., Michelson interferometer. An ac driving voltage was applied to the sample to produce a chan...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Prince of Songkla University
2003-09-01
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| Series: | Songklanakarin Journal of Science and Technology (SJST) |
| Subjects: | |
| Online Access: | http://www.sjst.psu.ac.th/journal/25-5-pdf/08interferometer.pdf |