X-ray microtomography investigations on the residual pore structure in silicon nitride bars manufactured by direct ink writing using different printing patterns

X-ray microtomography investigations on the residual pore structure in silicon nitride bars manufactured by direct ink writing using different printing patterns

Printing bulk parts by Direct Ink Writing (DIW) is challenging. Aspects like the printing strategy (pathways followed by the nozzle) or drying parameters can have a significant influence on the quality of the resulting sample, besides the rheological characteristics of the ink. Different drying meth...

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Bibliographic Details
Main Authors: Sarah Diener, Giorgia Franchin, Nils Achilles, Torben Kuhnt, Felix Rösler, Nikolaos Katsikis, Paolo Colombo
Format: Article
Language:English
Published: Elsevier 2021-03-01
Series:Open Ceramics
Subjects:
Direct ink writing
Silicon nitride
Additive manufacturing
μCT
Computer tomography
Online Access:http://www.sciencedirect.com/science/article/pii/S2666539520300420

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http://www.sciencedirect.com/science/article/pii/S2666539520300420

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