Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products

Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products

Recent developments in high-resolution time-of-flight chemical ionization mass spectrometry (HR-ToF-CIMS) have made it possible to directly detect atmospheric organic compounds in real time with high sensitivity and with little or no fragmentation, including low-volatility, highly oxygenated organic...

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Bibliographic Details
Main Authors: P. S. Chhabra, A. T. Lambe, M. R. Canagaratna, H. Stark, J. T. Jayne, T. B. Onasch, P. Davidovits, J. R. Kimmel, D. R. Worsnop
Format: Article
Language:English
Published: Copernicus Publications 2015-01-01
Series:Atmospheric Measurement Techniques
Online Access:http://www.atmos-meas-tech.net/8/1/2015/amt-8-1-2015.pdf

Internet

http://www.atmos-meas-tech.net/8/1/2015/amt-8-1-2015.pdf

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