Refractive index profile renormalization for a silicon waveguide bend
An index profile renormalization method is proposed to study the effective refraction index increase in a high-index contrast waveguide bend such as a silicon waveguide bend. This method transforms a waveguide bend to an equivalent straight waveguide (ESW). The simulation results show that the ESW m...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2023-01-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/5.0131247 |