Research on Electromagnetic Susceptibility of Electronic Modules in Component-Level HEMP PCI Test

Research on Electromagnetic Susceptibility of Electronic Modules in Component-Level HEMP PCI Test

The study of electromagnetic sensitivity of electronic modules is crucial for the selection of a component-level pulse current injection (PCI) waveform, which will determine whether a component-level PCI test is equivalent to a system-level pulse illumination test of the system to which the electron...

Full description

Bibliographic Details
Main Authors: Chuanbao Du, Dewei Xia, Quan Huang, Congguang Mao, Zhitong Cui, Wenxiao Fang, Xin Nie
Format: Article
Language:English
Published: MDPI AG 2022-02-01
Series:Energies
Subjects:
pulsed current injection
low noise amplifier
HEMP
electromagnetic sensitivity
effect mechanism
vector norm theory
Online Access:https://www.mdpi.com/1996-1073/15/4/1409

Internet

https://www.mdpi.com/1996-1073/15/4/1409

Similar Items