Interface Analysis of MOCVD Grown GeTe/Sb<sub>2</sub>Te<sub>3</sub> and Ge-Rich Ge-Sb-Te/Sb<sub>2</sub>Te<sub>3</sub> Core-Shell Nanowires

Interface Analysis of MOCVD Grown GeTe/Sb<sub>2</sub>Te<sub>3</sub> and Ge-Rich Ge-Sb-Te/Sb<sub>2</sub>Te<sub>3</sub> Core-Shell Nanowires

Controlling material thickness and element interdiffusion at the interface is crucial for many applications of core-shell nanowires. Herein, we report the thickness-controlled and conformal growth of a Sb<sub>2</sub>Te<sub>3</sub> shell over GeTe and Ge-rich Ge-Sb-Te core nan...

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Bibliographic Details
Main Authors: Arun Kumar, Seyed Ariana Mirshokraee, Alessio Lamperti, Matteo Cantoni, Massimo Longo, Claudia Wiemer
Format: Article
Language:English
Published: MDPI AG 2022-05-01
Series:Nanomaterials
Subjects:
MOCVD
XPS
Ge-rich Ge-Sb-Te/Sb<sub>2</sub>Te<sub>3</sub>
GeTe/Sb<sub>2</sub>Te<sub>3</sub>
core-shell nanowires
Online Access:https://www.mdpi.com/2079-4991/12/10/1623

Internet

https://www.mdpi.com/2079-4991/12/10/1623

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