Interface Analysis of MOCVD Grown GeTe/Sb<sub>2</sub>Te<sub>3</sub> and Ge-Rich Ge-Sb-Te/Sb<sub>2</sub>Te<sub>3</sub> Core-Shell Nanowires

Interface Analysis of MOCVD Grown GeTe/Sb<sub>2</sub>Te<sub>3</sub> and Ge-Rich Ge-Sb-Te/Sb<sub>2</sub>Te<sub>3</sub> Core-Shell Nanowires

Controlling material thickness and element interdiffusion at the interface is crucial for many applications of core-shell nanowires. Herein, we report the thickness-controlled and conformal growth of a Sb<sub>2</sub>Te<sub>3</sub> shell over GeTe and Ge-rich Ge-Sb-Te core nan...

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Bibliographic Details
Main Authors:	Arun Kumar, Seyed Ariana Mirshokraee, Alessio Lamperti, Matteo Cantoni, Massimo Longo, Claudia Wiemer
Format:	Article
Language:	English
Published:	MDPI AG 2022-05-01
Series:	Nanomaterials
Subjects:	MOCVD XPS Ge-rich Ge-Sb-Te/Sb<sub>2</sub>Te<sub>3</sub> GeTe/Sb<sub>2</sub>Te<sub>3</sub> core-shell nanowires
Online Access:	https://www.mdpi.com/2079-4991/12/10/1623

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