A Discrete Event System approach to On-line Testing of digital circuits with measurement limitation
In the present era of complex systems like avionics, industrial processes, electronic circuits, etc., on-the-fly or on-line fault detection is becoming necessary to provide uninterrupted services. Measurement limitation based fault detection schemes are applied to a wide range of systems because sen...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2016-09-01
|
| Series: | Engineering Science and Technology, an International Journal |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2215098616300192 |