Detection of Corrosion in Thick Film Resistors by X-Ray Imaging

Detection of Corrosion in Thick Film Resistors by X-Ray Imaging

In this article, a non-destructive method is presented, using 2D X-ray imaging, to investigate corrosion defects in thick film resistors stressed by two different corrosion experiments, a single gas experiment and a flowers of sulphur experiment. In total, 370 devices under test (DUTs) were investig...

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Bibliographic Details
Main Authors: Jonny M. Ingman, Joni P. A. Jormanainen, Samu K. Jarvinen, Natalia I. Kanko, Joonas A. R. Leppanen, Aleksi M. Vulli, Tommi J. Karkkainen, Juuso Rautio, Janne Jappinen, Pertti Silventoinen
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Corrosion
resistors
failure analysis
scanning electron microscopy
silver
sulphur
Online Access:https://ieeexplore.ieee.org/document/9551978/

Internet

https://ieeexplore.ieee.org/document/9551978/

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