Electron microscopy characterization of grain boundaries in Nb1-xTixFeSb based half-Heusler thermoelectric materials

Bibliographic Details
Main Authors:	Mattlat Dominique, Villoro Ruben Bueno, Jung Chanwon, Naderloo Raana Hatami, He Ran, Nielsch Kornelius, Zavanelli Duncan, Snyder G. Jeffrey, Zhang Siyuan, Scheu Christina
Format:	Article
Language:	English
Published:	EDP Sciences 2024-01-01
Series:	BIO Web of Conferences
Subjects:	sem ebsd stem apt thermoelectrics
Online Access:	https://www.bio-conferences.org/articles/bioconf/pdf/2024/48/bioconf_emc2024_25055.pdf

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