The Fingerprints of Resonant Frequency for Atomic Vacancy Defect Identification in Graphene

The Fingerprints of Resonant Frequency for Atomic Vacancy Defect Identification in Graphene

The identification of atomic vacancy defects in graphene is an important and challenging issue, which involves inhomogeneous spatial randomness and requires high experimental conditions. In this paper, the fingerprints of resonant frequency for atomic vacancy defect identification are provided, base...

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Bibliographic Details
Main Authors: Liu Chu, Jiajia Shi, Eduardo Souza de Cursi
Format: Article
Language:English
Published: MDPI AG 2021-12-01
Series:Nanomaterials
Subjects:
fingerprints
atomic vacancy defects
resonant frequencies
graphene
Online Access:https://www.mdpi.com/2079-4991/11/12/3451

Internet

https://www.mdpi.com/2079-4991/11/12/3451

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