Optical and Microstructural Characterization of Thin Layers
The microstructure and optical properties of layers strongly depend on the method of synthesis. This Special Issue on “Optical and Microstructural Characterization of Thin Layers” is a collection of papers on the relationships between the growth conditions and specific properties of thin films.
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| Format: | Article |
| Language: | English |
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MDPI AG
2020-08-01
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| Series: | Crystals |
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| Online Access: | https://www.mdpi.com/2073-4352/10/9/749 |