An LCD Detection Method Based on the Simultaneous Automatic Generation of Samples and Masks Using Generative Adversarial Networks
When applying deep learning methods to detect micro defects on low-contrast LCD surfaces, there are challenges related to imbalances in sample datasets and the complexity and laboriousness of annotating and acquiring target image masks. In order to solve these problems, a method based on sample and...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-12-01
|
| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/12/24/5037 |