Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration

Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration

We develop a sampling-type algorithm for localizing a small object from scattering parameter data measured in a bistatic configuration. To this end, we design a sampling-type imaging function based on the integral equation formula for the scattering parameter. To clarify its applicability, we show t...

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Bibliographic Details
Main Authors: Seong-Ho Son, Won-Kwang Park
Format: Article
Language:English
Published: MDPI AG 2022-09-01
Series:Electronics
Subjects:
Bessel function
bistatic imaging
scattering parameter
simulation results
Online Access:https://www.mdpi.com/2079-9292/11/19/3054

Internet

https://www.mdpi.com/2079-9292/11/19/3054

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