Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration

We develop a sampling-type algorithm for localizing a small object from scattering parameter data measured in a bistatic configuration. To this end, we design a sampling-type imaging function based on the integral equation formula for the scattering parameter. To clarify its applicability, we show t...

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Main Authors: Seong-Ho Son, Won-Kwang Park
Format: Article
Language:English
Published: MDPI AG 2022-09-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/11/19/3054
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author Seong-Ho Son
Won-Kwang Park
author_facet Seong-Ho Son
Won-Kwang Park
author_sort Seong-Ho Son
collection DOAJ
description We develop a sampling-type algorithm for localizing a small object from scattering parameter data measured in a bistatic configuration. To this end, we design a sampling-type imaging function based on the integral equation formula for the scattering parameter. To clarify its applicability, we show that the imaging function can be expressed by the bistatic angle, antenna arrangement, and Bessel function of an integer order. This result reveals some properties of the imaging function and influence of the selection of the bistatic angle. Numerical experiments are carried out for single and multiple small and large objectives to illustrate the pros and cons of the developed algorithm.
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spelling doaj.art-a4412c29cd294b56a35e97bcdf1433642023-11-23T20:05:31ZengMDPI AGElectronics2079-92922022-09-011119305410.3390/electronics11193054Localization of Small Objectives from Scattering Parameter via Bistatic Measurement ConfigurationSeong-Ho Son0Won-Kwang Park1Department of Mechanical Engineering, Soonchunhyang University, Asan 31538, KoreaDepartment of Information Security, Cryptology and Mathematics, Kookmin University, Seoul 02707, KoreaWe develop a sampling-type algorithm for localizing a small object from scattering parameter data measured in a bistatic configuration. To this end, we design a sampling-type imaging function based on the integral equation formula for the scattering parameter. To clarify its applicability, we show that the imaging function can be expressed by the bistatic angle, antenna arrangement, and Bessel function of an integer order. This result reveals some properties of the imaging function and influence of the selection of the bistatic angle. Numerical experiments are carried out for single and multiple small and large objectives to illustrate the pros and cons of the developed algorithm.https://www.mdpi.com/2079-9292/11/19/3054Bessel functionbistatic imagingscattering parametersimulation results
spellingShingle Seong-Ho Son
Won-Kwang Park
Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration
Electronics
Bessel function
bistatic imaging
scattering parameter
simulation results
title Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration
title_full Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration
title_fullStr Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration
title_full_unstemmed Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration
title_short Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration
title_sort localization of small objectives from scattering parameter via bistatic measurement configuration
topic Bessel function
bistatic imaging
scattering parameter
simulation results
url https://www.mdpi.com/2079-9292/11/19/3054
work_keys_str_mv AT seonghoson localizationofsmallobjectivesfromscatteringparameterviabistaticmeasurementconfiguration
AT wonkwangpark localizationofsmallobjectivesfromscatteringparameterviabistaticmeasurementconfiguration