Next-to SV resummed Drell–Yan cross section beyond leading-logarithm
Abstract We present the resummed predictions for inclusive cross section for Drell–Yan (DY) production up to next-to-next-to leading logarithmic ( $${{\overline{\mathrm{NNLL}}}}$$ NNLL ¯ ) accuracy taking into account both soft virtual (SV) and next-to SV (NSV) threshold logarithms. We restrict ours...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2022-03-01
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| Series: | European Physical Journal C: Particles and Fields |
| Online Access: | https://doi.org/10.1140/epjc/s10052-022-10174-7 |