Quantitative laser-based x-ray fluorescence and particle-induced x-ray emission

In this work, we demonstrate the feasibility of quantitative laser-based x-ray fluorescence (XRF) combined with particle-induced x-ray emission (PIXE) (called XPIF for x-ray and particle-induced fluorescence) spectroscopy analysis for elemental composition in solid samples. A multi-hundred TW laser...

Full description

Bibliographic Details
Main Authors: Frédéric Boivin, Simon Vallières, Sylvain Fourmaux, Stéphane Payeur, Patrizio Antici
Format: Article
Language:English
Published: IOP Publishing 2022-01-01
Series:New Journal of Physics
Subjects:
Online Access:https://doi.org/10.1088/1367-2630/ac6767