Quantitative laser-based x-ray fluorescence and particle-induced x-ray emission
In this work, we demonstrate the feasibility of quantitative laser-based x-ray fluorescence (XRF) combined with particle-induced x-ray emission (PIXE) (called XPIF for x-ray and particle-induced fluorescence) spectroscopy analysis for elemental composition in solid samples. A multi-hundred TW laser...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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IOP Publishing
2022-01-01
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| Series: | New Journal of Physics |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/1367-2630/ac6767 |
| _version_ | 1797748441052348416 |
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| author | Frédéric Boivin Simon Vallières Sylvain Fourmaux Stéphane Payeur Patrizio Antici |
| author_facet | Frédéric Boivin Simon Vallières Sylvain Fourmaux Stéphane Payeur Patrizio Antici |
| author_sort | Frédéric Boivin |
| collection | DOAJ |
| description | In this work, we demonstrate the feasibility of quantitative laser-based x-ray fluorescence (XRF) combined with particle-induced x-ray emission (PIXE) (called XPIF for x-ray and particle-induced fluorescence) spectroscopy analysis for elemental composition in solid samples. A multi-hundred TW laser system accelerated protons and produced x-rays that were impinging on solid samples, inducing characteristic line emissions of the elements contained in the material. The x-ray yield obtained from the characteristic emissions for each element can be related to its mass concentration using both the thick PIXE and thick XRF formalism. This is performed by using of an iterative numerical procedure. We tested the validity of our method on three homogeneous metallic materials, stainless steel, bronze and brass. The mass proportions of these samples retrieved by our analysis (XPIF) is within the errors bars compared with a commercial energy dispersive x-ray spectrometer. |
| first_indexed | 2024-03-12T16:05:48Z |
| format | Article |
| id | doaj.art-a49423799a424f329ca7e7205286b8d1 |
| institution | Directory Open Access Journal |
| issn | 1367-2630 |
| language | English |
| last_indexed | 2024-03-12T16:05:48Z |
| publishDate | 2022-01-01 |
| publisher | IOP Publishing |
| record_format | Article |
| series | New Journal of Physics |
| spelling | doaj.art-a49423799a424f329ca7e7205286b8d12023-08-09T14:23:57ZengIOP PublishingNew Journal of Physics1367-26302022-01-0124505301810.1088/1367-2630/ac6767Quantitative laser-based x-ray fluorescence and particle-induced x-ray emissionFrédéric Boivin0Simon Vallières1https://orcid.org/0000-0002-5113-8478Sylvain Fourmaux2Stéphane Payeur3Patrizio Antici4INRS-EMT , 1650 Blvd. Lionel-Boulet, Varennes, QC, J3X 1P7, CanadaInstitute for Quantum Computing, 200 University Ave W., University of Waterloo , Waterloo, ON, N2L 3G1, CanadaINRS-EMT , 1650 Blvd. Lionel-Boulet, Varennes, QC, J3X 1P7, CanadaINRS-EMT , 1650 Blvd. Lionel-Boulet, Varennes, QC, J3X 1P7, CanadaINRS-EMT , 1650 Blvd. Lionel-Boulet, Varennes, QC, J3X 1P7, CanadaIn this work, we demonstrate the feasibility of quantitative laser-based x-ray fluorescence (XRF) combined with particle-induced x-ray emission (PIXE) (called XPIF for x-ray and particle-induced fluorescence) spectroscopy analysis for elemental composition in solid samples. A multi-hundred TW laser system accelerated protons and produced x-rays that were impinging on solid samples, inducing characteristic line emissions of the elements contained in the material. The x-ray yield obtained from the characteristic emissions for each element can be related to its mass concentration using both the thick PIXE and thick XRF formalism. This is performed by using of an iterative numerical procedure. We tested the validity of our method on three homogeneous metallic materials, stainless steel, bronze and brass. The mass proportions of these samples retrieved by our analysis (XPIF) is within the errors bars compared with a commercial energy dispersive x-ray spectrometer.https://doi.org/10.1088/1367-2630/ac6767high-power laserslaser-driven particle beamsx-ray spectroscopymaterial composition analysisradiation physics |
| spellingShingle | Frédéric Boivin Simon Vallières Sylvain Fourmaux Stéphane Payeur Patrizio Antici Quantitative laser-based x-ray fluorescence and particle-induced x-ray emission New Journal of Physics high-power lasers laser-driven particle beams x-ray spectroscopy material composition analysis radiation physics |
| title | Quantitative laser-based x-ray fluorescence and particle-induced x-ray emission |
| title_full | Quantitative laser-based x-ray fluorescence and particle-induced x-ray emission |
| title_fullStr | Quantitative laser-based x-ray fluorescence and particle-induced x-ray emission |
| title_full_unstemmed | Quantitative laser-based x-ray fluorescence and particle-induced x-ray emission |
| title_short | Quantitative laser-based x-ray fluorescence and particle-induced x-ray emission |
| title_sort | quantitative laser based x ray fluorescence and particle induced x ray emission |
| topic | high-power lasers laser-driven particle beams x-ray spectroscopy material composition analysis radiation physics |
| url | https://doi.org/10.1088/1367-2630/ac6767 |
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