Quantitative laser-based x-ray fluorescence and particle-induced x-ray emission

Quantitative laser-based x-ray fluorescence and particle-induced x-ray emission

In this work, we demonstrate the feasibility of quantitative laser-based x-ray fluorescence (XRF) combined with particle-induced x-ray emission (PIXE) (called XPIF for x-ray and particle-induced fluorescence) spectroscopy analysis for elemental composition in solid samples. A multi-hundred TW laser...

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Bibliographic Details
Main Authors:	Frédéric Boivin, Simon Vallières, Sylvain Fourmaux, Stéphane Payeur, Patrizio Antici
Format:	Article
Language:	English
Published:	IOP Publishing 2022-01-01
Series:	New Journal of Physics
Subjects:	high-power lasers laser-driven particle beams x-ray spectroscopy material composition analysis radiation physics
Online Access:	https://doi.org/10.1088/1367-2630/ac6767

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