Effects of surface roughness on measurements of characteristic X-ray yields of thick Ni target by low-energy electron impact
BackgroundAccurate measurements of characteristic X-ray yields of Ni by electron impact play an important role in electron probe and auger electron spectroscopy analysises of Ni materials. However, the surface roughness of thick Ni targets may adversely affect the accuracy of these measurements.Purp...
| Main Authors: | , , |
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| Format: | Article |
| Language: | zho |
| Published: |
Science Press
2021-11-01
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| Series: | He jishu |
| Subjects: | |
| Online Access: | https://www.hjs.sinap.ac.cn/thesisDetails#10.11889/j.0253-3219.2021.hjs.44.110201&lang=zh |