Design of High-Robustness LDO Regulator With Floating SCR Based ESD Protection Circuit Using High Gain Buffer

Design of High-Robustness LDO Regulator With Floating SCR Based ESD Protection Circuit Using High Gain Buffer

Currently, in the semiconductor market, reliability response to Electro Static Discharge (ESD) situations is being discussed as an alternative to internal Integrated Circuit (IC) destruction. In this paper, the ESD protection circuit design integrated into the Low Drop Out (LDO) regulator presents a...

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Bibliographic Details
Main Authors: Sang-Wook Kwon, Kyoung-Il Do, Jeong-Min Lee, U-Yeol Seo, Yong-Seo Koo
Format: Article
Language:English
Published: IEEE 2024-01-01
Series:IEEE Access
Subjects:
LDO regulator
high reliability
ESD protection circuit
SCR
LDO regulator in integrated with ESD protection circuit
Online Access:https://ieeexplore.ieee.org/document/10453570/

Internet

https://ieeexplore.ieee.org/document/10453570/

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