Design of High-Robustness LDO Regulator With Floating SCR Based ESD Protection Circuit Using High Gain Buffer
Currently, in the semiconductor market, reliability response to Electro Static Discharge (ESD) situations is being discussed as an alternative to internal Integrated Circuit (IC) destruction. In this paper, the ESD protection circuit design integrated into the Low Drop Out (LDO) regulator presents a...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
IEEE
2024-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/10453570/ |