Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments
We present a simulation environment, dForce, which can be used for a better understanding of dynamic force microscopy experiments. The simulator presents the cantilever–tip dynamics for two dynamic AFM methods, tapping mode AFM and bimodal AFM. It can be applied for a wide variety of experimental si...
Main Authors: | , , |
---|---|
Format: | Article |
Language: | English |
Published: |
Beilstein-Institut
2015-02-01
|
Series: | Beilstein Journal of Nanotechnology |
Subjects: | |
Online Access: | https://doi.org/10.3762/bjnano.6.36 |