Polymer Nanoparticles Applied in the CMP (Chemical Mechanical Polishing) Process of Chip Wafers for Defect Improvement and Polishing Removal Rate Response

Chemical mechanical planarization (CMP) is a wafer-surface-polishing planarization technique based on a wet procedure that combines chemical and mechanical forces to fully flatten materials for semiconductors to be mounted on the wafer surface. The achievement of devices of a small nano-size with fe...

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Bibliographic Details
Main Authors: Wei-Lan Chiu, Ching-I Huang
Format: Article
Language:English
Published: MDPI AG 2023-07-01
Series:Polymers
Subjects:
Online Access:https://www.mdpi.com/2073-4360/15/15/3198