Compressed Gate Characterization for Quantum Devices with Time-Correlated Noise
As quantum devices make steady progress towards intermediate scale and fault-tolerant quantum computing, it is essential to develop rigorous and efficient measurement protocols that account for known sources of noise. Most existing quantum characterization protocols such as gate-set tomography and r...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
American Physical Society
2024-01-01
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| Series: | PRX Quantum |
| Online Access: | http://doi.org/10.1103/PRXQuantum.5.010306 |