Compressed Gate Characterization for Quantum Devices with Time-Correlated Noise

Compressed Gate Characterization for Quantum Devices with Time-Correlated Noise

As quantum devices make steady progress towards intermediate scale and fault-tolerant quantum computing, it is essential to develop rigorous and efficient measurement protocols that account for known sources of noise. Most existing quantum characterization protocols such as gate-set tomography and r...

Full description

Bibliographic Details
Main Authors: M.J. Gullans, M. Caranti, A.R. Mills, J.R. Petta
Format: Article
Language:English
Published: American Physical Society 2024-01-01
Series:PRX Quantum
Online Access:http://doi.org/10.1103/PRXQuantum.5.010306

Similar Items

Similar Items