Measurement of Submicron Particle Size Using Scattering Angle-Corrected Polarization Difference with High Angular Resolution
The particle size of submicron particles significantly affects their properties; thus, the accurate measurement of submicron particle size is essential to ensure its excellent properties. Polarized light scattering is an important tool for measuring the particle size of the ensemble of particles in...
| Autori principali: | , , , , , , , |
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| Natura: | Articolo |
| Lingua: | English |
| Pubblicazione: |
MDPI AG
2023-11-01
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| Serie: | Photonics |
| Soggetti: | |
| Accesso online: | https://www.mdpi.com/2304-6732/10/11/1282 |