Assessing Durum Wheat Yield through Sentinel-2 Imagery: A Machine Learning Approach
Two modeling approaches for the estimation of durum wheat yield based on Sentinel-2 data are presented for 66 fields across three growing periods. In the first approach, a previously developed multiple linear regression model (VI-MLR) based on vegetation indices (EVI, NMDI) was used. In the second a...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-08-01
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| Series: | Remote Sensing |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2072-4292/14/16/3880 |