Intermodal coupling spectroscopy of mechanical modes in microcantilevers

Atomic force microscopy (AFM) is highly regarded as a lens peering into the next discoveries of nanotechnology. Fundamental research in atomic interactions, molecular reactions, and biological cell behaviour are key focal points, demanding a continuous increase in resolution and sensitivity. While r...

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Bibliographic Details
Main Authors: Ioan Ignat, Bernhard Schuster, Jonas Hafner, MinHee Kwon, Daniel Platz, Ulrich Schmid
Format: Article
Language:English
Published: Beilstein-Institut 2023-01-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.14.13