Two-Stage Alignment of FIB-SEM Images of Rock Samples
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) tomography provides a stack of images that represent serial slices of the sample. These images are displaced relatively to each other, and an alignment procedure is required. Traditional methods for alignment of a 3D image are based on a compar...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-10-01
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| Series: | Journal of Imaging |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2313-433X/6/10/107 |