A system-level method for hardening phase-locked loop to single-event effects

To mitigate the sensitivity of the charge pump in a traditional Phase-Locked Loop(PLL), a single-event-hardened PLL architecture with a proportional and integral path is proposed. The phase margin of the PLL is kept at 58.16° due to the rational design and the output clock frequency ranges from 0.8...

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Bibliographic Details
Main Authors: Bin Liang, Xinyu Xu, Hengzhou Yuan, Jianjun Chen, Deng Luo, Yaqing Chi, Hanhan Sun
Format: Article
Language:English
Published: IOP Publishing 2022-01-01
Series:Materials Research Express
Subjects:
Online Access:https://doi.org/10.1088/2053-1591/ac8f87