Terahertz Super-Resolution Nondestructive Detection Algorithm Based on Edge Feature Convolution Network

Much research has been conducted to improve the defect-detection rate and detection accuracy of the imaging technology used in terahertz nondestructive testing. Due to the power limit of light sources and noise interference in terahertz equipment, images have low resolution and fuzzy defect edges. H...

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Bibliographic Details
Main Authors: Cong Hu, Hui Quan, Xiangdong Wu, Ting Li, Tian Zhou
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9798838/