Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process

Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process

Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic–inorganic hybrid perovskite CH3NH3PbI3 (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted fr...

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Bibliographic Details
Main Authors: Laurie J. Phillips, Atef M. Rashed, Robert E. Treharne, James Kay, Peter Yates, Ivona Z. Mitrovic, Ayendra Weerakkody, Steve Hall, Ken Durose
Format: Article
Language:English
Published: Elsevier 2015-12-01
Series:Data in Brief
Online Access:http://www.sciencedirect.com/science/article/pii/S2352340915002747

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http://www.sciencedirect.com/science/article/pii/S2352340915002747

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