Evidence of $\phi_0$-Josephson junction from skewed diffraction patterns in Sn-InSb nanowires

Evidence of $\phi_0$-Josephson junction from skewed diffraction patterns in Sn-InSb nanowires

We study Josephson junctions based on InSb nanowires with Sn shells. We observe skewed critical current diffraction patterns: the maxima in forward and reverse current bias are at different magnetic flux, with a displacement of 20-40 mT. The skew is greatest when the external field is nearly perpend...

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Bibliographic Details
Main Author: B. Zhang, Z. Li, V. Aguilar, P. Zhang, M. Pendharkar, C. Dempsey, J. S. Lee, S. D. Harrington, S. Tan, J. S. Meyer, M. Houzet, C. J. Palmstrom, S. M. Frolov
Format: Article
Language:English
Published: SciPost 2025-01-01
Series:SciPost Physics
Online Access:https://scipost.org/SciPostPhys.18.1.013

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https://scipost.org/SciPostPhys.18.1.013

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