A Naive-Bayes-Based Fault Diagnosis Approach for Analog Circuit by Using Image-Oriented Feature Extraction and Selection Technique

A Naive-Bayes-Based Fault Diagnosis Approach for Analog Circuit by Using Image-Oriented Feature Extraction and Selection Technique

Analog circuit is one of the most commonly used components in industrial equipment, and circuit failure may lead to significant causalities and even enormous financial losses. To address this problem, a novel scheme based on the wavelet spectrum features, feature selection, and Naive Bayes classifie...

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Bibliographic Details
Main Authors: Wei He, Yigang He, Bing Li, Chaolong Zhang
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Analog circuit
fault diagnosis
cross-wavelet transform (XWT)
local optimal oriented pattern (LOOP)
Hilbert Schmidt independence criterion (HSIC)
kernel Fisher linear discriminant analysis (KLDA)
Online Access:https://ieeexplore.ieee.org/document/8781763/

Internet

https://ieeexplore.ieee.org/document/8781763/

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