A Refined Quasi‐Static Method for Precise Determination of Piezoelectric Coefficient of Nanostructured Standard and Inclined Thin Films

A Refined Quasi‐Static Method for Precise Determination of Piezoelectric Coefficient of Nanostructured Standard and Inclined Thin Films

Abstract Piezoelectric materials are key components for applications including non‐destructive testing, medical imaging, energy harvesting, ultrasonic sensors, and actuators. Among different materials exhibiting piezoelectricity, crystalline thin films are proposed as alternative candidates to repla...

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Bibliographic Details
Main Authors: Manuel Pelayo Garcia, Desmond Gibson, Dave Allan Hughes, Carlos Garcia Nuñez
Format: Article
Language:English
Published: Wiley-VCH 2024-03-01
Series:Advanced Physics Research
Subjects:
Berlincourt
piezoelectric materials
quasi‐static method
thin films
zinc oxide
Online Access:https://doi.org/10.1002/apxr.202300091

Internet

https://doi.org/10.1002/apxr.202300091

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