Meta-Surface Slide for High-Contrast Dark-Field Imaging
A label-free microscopy technology, dark-field microscopy, is widely used for providing high-contrast imaging for weakly scattering materials and unstained samples. However, traditional dark-field microscopes often require additional components and larger condensers as the numerical aperture increas...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-07-01
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| Series: | Photonics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2304-6732/10/7/775 |