A Comparative Investigation of Mechanical Properties of TiB<sub>2</sub>/Cr Multilayer Film by Indentation

Alternating TiB<sub>2</sub>-dcMS and Cr-HiPIMS layers are used to fabricate TiB<sub>2</sub>/Cr multilayer films. Introducing a 5-nm-thick Cr interlayer deposited under a substrate bias of −60 V produces slight increases in both film hardness and elastic modulus. The TEM obser...

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Xehetasun bibliografikoak
Egile Nagusiak: Simeng Chen, Zhengtao Wu, Qimin Wang
Formatua: Artikulua
Hizkuntza:English
Argitaratua: MDPI AG 2022-11-01
Saila:Magnetochemistry
Gaiak:
Sarrera elektronikoa:https://www.mdpi.com/2312-7481/8/11/148
Deskribapena
Gaia:Alternating TiB<sub>2</sub>-dcMS and Cr-HiPIMS layers are used to fabricate TiB<sub>2</sub>/Cr multilayer films. Introducing a 5-nm-thick Cr interlayer deposited under a substrate bias of −60 V produces slight increases in both film hardness and elastic modulus. The TEM observation indicates that the Cr grains favor epitaxial growth on the TiB<sub>2</sub> interlayer, forming a coherent TiB<sub>2</sub>/Cr interface. This improves hardness. Mechanic measurement by using AFM illustrates that the coherent interface increases the elastic modulus of the Cr up to ~280 GPa, which is significantly higher than bulk material.
ISSN:2312-7481