Atomic scale investigation of silicon nanowires and nanoclusters

Atomic scale investigation of silicon nanowires and nanoclusters

<p>Abstract</p> <p>In this study, we have performed nanoscale characterization of Si-clusters and Si-nanowires with a laser-assisted tomographic atom probe. Intrinsic and <it>p</it>-type silicon nanowires (SiNWs) are elaborated by chemical vapor deposition method using...

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Bibliographic Details
Main Authors: Gourbilleau Fabrice, Grandidier Bruno, Sti&#233;venard Didier, Roussel Manuel, Chen Wanghua, Talbot Etienne, Lard&#233; Rodrigue, Cadel Emmanuel, Pareige Philippe
Format: Article
Language:English
Published: SpringerOpen 2011-01-01
Series:Nanoscale Research Letters
Online Access:http://www.nanoscalereslett.com/content/6/1/271

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http://www.nanoscalereslett.com/content/6/1/271

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