Selective Growth of Homo-Epitaxial Ag-Nano-Layer on Tribo-Assisted-Reorientation
The growth process and orientational degree of incremental-Ag films with a thickness of 5, 50 and 500 nm, respectively, on reoriented Ag (111) surface were studied by in-situ reflection high-energy electron diffraction (RHEED). The orientation of Ag grains for each incremental-Ag-film was also analy...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Japanese Society of Tribologists
2008-04-01
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| Series: | Tribology Online |
| Subjects: | |
| Online Access: | https://www.jstage.jst.go.jp/article/trol/3/3/3_3_173/_pdf/-char/en |